T. Bouyssou : rechercher sur Z-Library

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1

Effects of cathode electrolyte interfacial (CEI) layer on long term cycling of all-solid-state thin-film batteries

Wang, Ziying, Lee, Jungwoo Z., Xin, Huolin L., Han, Lili, Grillon, Nathanael, Guy-Bouyssou, Delphine, Bouyssou, Emilien, Proust, Marina, Meng, Ying Shirley

Journal:

Journal of Power Sources

Année:

2016

Langue:

english

Fichier:

PDF, 1.56 MB

english, 2016

2

Bounded Rationality Modeling

Bertrand Munier, Reinhard Selten, D. Bouyssou, P. Bourgine, R. Day, N. Harvey, D. Hilton, M. J. Machina, Ph. Parker, J. Sterman, E. Weber, B. Wernerfelt, R. Wensley

Journal:

Marketing Letters

Année:

1999

Langue:

english

Fichier:

PDF, 94 KB

english, 1999

3

HEC Choice Symposium || Bounded Rationality Modeling

Bertrand Munier, Reinhard Selten, Denis Bouyssou, Paul Bourgine, Richard Day, Nigel Harvey, Denis Hilton, Mark J. Machina, Phil Parker, Hon Sterman, J. Sterman, Elke Weber, Birger Wernerfelt and Robin

Journal:

Marketing Letters

Année:

1999

Langue:

english

Fichier:

PDF, 1.46 MB

english, 1999

4

Interfacial stability and electrochemical behavior of Li/LiFePO4 batteries using novel soft and weakly adhesive photo-ionogel electrolytes

Aidoud, D., Etiemble, A., Guy-Bouyssou, D., Maire, E., Le Bideau, J., Guyomard, D., Lestriez, B.

Journal:

Journal of Power Sources

Année:

2016

Langue:

english

Fichier:

PDF, 3.20 MB

english, 2016

5

L'État développeur : défense du concept

Thurbon, Elizabeth, Bouyssou, Rachel

Journal:

Critique internationale

Année:

2014

Langue:

french

Fichier:

PDF, 767 KB

french, 2014

6

Saul I. Gass, Arjang A. Assad, ,An Annotated Timeline of Operations Research, An Informal History (2005) Kluwer.

Journal:

European Journal of Operational Research

Année:

2006

Langue:

english

Fichier:

PDF, 54 KB

english, 2006

7

Patterning of narrow porous SiOCH trenches using a TiN hard mask

M. Darnon, T. Chevolleau, D. Eon, R. Bouyssou, B. Pelissier, L. Vallier, O. Joubert, N. Posseme, T. David, F. Bailly, J. Torres

Journal:

Microelectronic Engineering

Année:

2008

Langue:

english

Fichier:

PDF, 1008 KB

english, 2008

8

Data Envelopment Analysis, A comprehensive text with models, applications, references and DEA-solver software, W.W. Cooper, L.M. Seiford and K. Tone; Kluwer, 1999, ISBN 0-7923-8693-0, 318 pages, EUR 136.00/USD 130.00

Journal:

European Journal of Operational Research

Année:

2003

Langue:

english

Fichier:

PDF, 138 KB

english, 2003

9

A case of plagiarism: Dănuţ Marcu

Denis Bouyssou, Silvano Martello, Frank Plastria

Journal:

4OR: A Quarterly Journal of Operations Research

Année:

2006

Langue:

english

Fichier:

PDF, 99 KB

english, 2006

10

[International Series in Operations Research & Management Science] Aiding Decisions with Multiple Criteria Volume 44 || Measuring Customer Satisfaction for Various Services Using Multicriteria Analysis

Bouyssou, Denis, Jacquet-Lagrèze, Eric, Perny, Patrice, Słowiński, Roman, Vanderpooten, Daniel, Vincke, Philippe

Année:

2002

Langue:

english

Fichier:

PDF, 2.10 MB

english, 2002

11

ECS Transactions [ECS China Semiconductor Technology International Conference 2011 (CSTIC 2011) - Shanghai, China (March 13 - March 14, 2011)] - Porous SiOCH Integration: Etch Challenges with a Trench First Metal Hard Mask Approach

Possémé, Nicolas, David, Thibaut, Chevolleau, Thierry, Darnon, Maxime, Brun, Philippe, Guillermet, Marc, Oddou, Jean Pierre, Barnola, Sebastien, Bailly, Fanny, Bouyssou, Regis, Ducote, Julien, Huran

Année:

2011

Langue:

english

Fichier:

PDF, 380 KB

english, 2011

12

[International Series in Operations Research & Management Science] Evaluation and Decision Models Volume 32 ||

Bouyssou, Denis, Marchant, Thierry, Pirlot, Marc, Perny, Patrice, Tsoukiàs, Alexis, Vincke, Philippe

Année:

2000

Langue:

english

Fichier:

PDF, 27.24 MB

english, 2000

13

LIFETIME EXTRAPOLATION OF PZT CAPACITORS

BOUYSSOU, EMILIEN, GUEGAN, GUILLAUME, JERISIAN, ROBERT

Journal:

Integrated Ferroelectrics

Année:

2005

Langue:

english

Fichier:

PDF, 526 KB

english, 2005

14

Cynisme, scepticisme et bon sens

Jacques Bouyssou

Journal:

La Revue administrative

Année:

2006

Langue:

french

Fichier:

PDF, 352 KB

french, 2006

15

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Advanced Etch Technology for Nanopatterning III - 28nm FDSOI high-K metal gate CD variability investigation

Oehrlein, Gottlieb S., Lin, Qinghuang, Zhang, Ying, Desvoivres, L., Gouraud, P., Le Gratiet, B., Bouyssou, R., Ranica, R., Gallon, C., Thomas, I.

Année:

2014

Langue:

english

Fichier:

PDF, 623 KB

english, 2014

16

RADIOGRAPHIC APPEARANCE OF PRESUMED NONCARDIOGENIC PULMONARY EDEMA AND CORRELATION WITH THE UNDERLYING CAUSE IN DOGS AND CATS

Bouyssou, Sarah, Specchi, Swan, Desquilbet, Loïc, Pey, Pascaline

Journal:

Veterinary Radiology & Ultrasound

Année:

2016

Langue:

english

Fichier:

PDF, 1.08 MB

english, 2016

17

L'ascension du capitalisme chinois : l'interdépendance n'empêche pas les tensions

ten Brink, Tobias, Bouyssou, Rachel

Journal:

Critique internationale

Année:

2014

Langue:

french

Fichier:

PDF, 786 KB

french, 2014

18

A Proustian experience with an uncut gem

Journal:

Journal of Multi-Criteria Decision Analysis

Année:

2006

Langue:

english

Fichier:

PDF, 122 KB

english, 2006

19

Democracy and efficiency: A note on “Arrow's theorem is not a surprising result”

Journal:

European Journal of Operational Research

Année:

1992

Langue:

english

Fichier:

PDF, 317 KB

english, 1992

20

Aspects of operational research: Tutorial and research review papers from EURO XIII/OR 36

Valerie Belton, Denis Bouyssou

Journal:

European Journal of Operational Research

Année:

1996

Langue:

english

Fichier:

PDF, 114 KB

english, 1996

21

Integration of gas cluster process for copper interconnects reliability improvement and process impact evaluation on BEOL dielectric materials

R. Gras, L.G. Gosset, M. Hopstaken, R. Bouyssou, T. Chevolleau, E. Petitprez, V. Girault, S. Jullian, J. Guillan, G. Imbert, D. Fossati, Y. Le Friec, J. Torres

Journal:

Microelectronic Engineering

Année:

2007

Langue:

english

Fichier:

PDF, 4.75 MB

english, 2007

22

Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD)

M. Diatta, E. Bouyssou, D. Trémouilles, P. Martinez, F. Roqueta, O. Ory, M. Bafleur

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 659 KB

english, 2009

23

Ordered categories and additive conjoint measurement on connected sets

D. Bouyssou, T. Marchant

Journal:

Journal of Mathematical Psychology

Année:

2009

Langue:

english

Fichier:

PDF, 3.04 MB

english, 2009

24

Reliability study of TaON capacitors: From leakage current characterization to ESD robustness prediction

Verchiani, M., Bouyssou, E., Fiannaca, G., Cantin, F., Anceau, C., Ranson, P.

Journal:

Microelectronics Reliability

Année:

2008

Langue:

english

Fichier:

PDF, 296 KB

english, 2008

25

Multi-solvent ellipsometric porosimetry analysis of plasma-treated porous SiOCH films

C. Licitra, R. Bouyssou, T. Chevolleau, F. Bertin

Journal:

Thin Solid Films

Année:

2010

Langue:

english

Fichier:

PDF, 875 KB

english, 2010

26

Application of scatterometric porosimetry to characterize porous ultra low-k patterned layers

C. Licitra, R. Bouyssou, M. El Kodadi, G. Haberfehlner, T. Chevolleau, J. Hazart, L. Virot, M. Besacier, P. Schiavone, F. Bertin

Journal:

Thin Solid Films

Année:

2011

Langue:

english

Fichier:

PDF, 756 KB

english, 2011

27

The atrophic variant of dermatofibrosarcoma protuberans in childhood: a report of six cases

L. Martin, P. Combemale, M. Dupin, B. Chouvet, J. Kanitakis, M-L. Bouyssou-Gauthier, G. Dubreuil, A. Claudy, P.S.GRIMAND Grimand

Journal:

British Journal of Dermatology

Année:

1998

Langue:

english

Fichier:

PDF, 532 KB

english, 1998

28

Plagiarism again: Sreenivas and Srinivas, with an update on Marcu

Denis Bouyssou, Silvano Martello, Frank Plastria

Journal:

4OR: A Quarterly Journal of Operations Research

Année:

2009

Langue:

english

Fichier:

PDF, 83 KB

english, 2009

29

Biorders with Frontier

Denis Bouyssou, Thierry Marchant

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 622 KB

english, 2011

30

Should you believe in the Shanghai ranking?

Jean-Charles Billaut, Denis Bouyssou, Philippe Vincke

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 372 KB

english, 2010

31

An axiomatic approach to noncompensatory sorting methods in MCDM, I: The case of two categories

Denis Bouyssou, Thierry Marchant

Journal:

European Journal of Operational Research

Année:

2007

Langue:

english

Fichier:

PDF, 411 KB

english, 2007

32

Percolation theory applied to PZT thin films capacitors breakdown mechanisms

M.T. Chentir, J.-B. Jullien, B. Valtchanov, E. Bouyssou, L. Ventura, C. Anceau

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 1013 KB

english, 2009

33

[International Series in Operations Research & Management Science] Aiding Decisions with Multiple Criteria ||

Bouyssou, Denis, Jacquet-Lagrèze, Eric, Perny, Patrice, Słowiński, Roman, Vanderpooten, Daniel, Vincke, Philippe

Année:

2002

Langue:

english

Fichier:

PDF, 2.20 MB

english, 2002

34

Decision-making Process || Formal Representations of Uncertainty

Bouyssou, Denis, Dubois, Didier, Pirlot, Marc, Prade, Henri

Année:

2009

Langue:

english

Fichier:

PDF, 582 KB

english, 2009

35

Decision-making Process || Cardinal Extensions of the EU Model Based on the Choquet Integral

Bouyssou, Denis, Dubois, Didier, Pirlot, Marc, Prade, Henri

Année:

2009

Langue:

english

Fichier:

PDF, 349 KB

english, 2009

36

Multiattribute preference models with reference points

Bouyssou, Denis, Marchant, Thierry

Journal:

European Journal of Operational Research

Année:

2013

Langue:

english

Fichier:

PDF, 403 KB

english, 2013

37

Investigation on Statistical Tools to Analyze Repetitive-Electrostatic-Discharge Endurance of System-Level Protections

Diatta, M. A., Tremouilles, D., Bouyssou, E., Bafleur, M.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2012

Langue:

english

Fichier:

PDF, 1.09 MB

english, 2012

38

ON THE ORIGIN OF CAVITIES IN PZT THIN FILM AND THEIR INFLUENCE ON CAPACITORS RELIABILITY

CHENTIR, M. T., VENTURA, L., BOUYSSOU, E., ANCEAU, C.

Journal:

Integrated Ferroelectrics

Année:

2010

Langue:

english

Fichier:

PDF, 509 KB

english, 2010

39

[IEEE 2010 IEEE International Interconnect Technology Conference - IITC - Burlingame, CA, USA (2010.06.6-2010.06.9)] 2010 IEEE International Interconnect Technology Conference - Etching process scalability and challenges for ULK materials

Chevolleau, T., Posseme, N., David, T., Bouyssou, R., Ducote, J., Bailly, F., Darnon, M., Kodadi, M. El, Besacier, M., Licitra, C., Guillermet, M., Ostrovsky, A., Verove, C., Joubert, O.

Année:

2010

Langue:

english

Fichier:

PDF, 1.63 MB

english, 2010

40

ELECTRICAL CHARACTERIZATION AND RELIABILITY OF LANTHANUM DOPED PZT THIN FILMS CAPACITORS

Chentir, M. T., Bouyssou, E., Ventura, L., Guégan, G., Anceau, C.

Journal:

Integrated Ferroelectrics

Année:

2008

Langue:

english

Fichier:

PDF, 677 KB

english, 2008

41

On the relations between ELECTRE TRI-B and ELECTRE TRI-C and on a new variant of ELECTRE TRI-B

Bouyssou, Denis, Marchant, Thierry

Journal:

European Journal of Operational Research

Année:

2015

Langue:

english

Fichier:

PDF, 558 KB

english, 2015

42

Preclinical Evaluation of Long-Acting Muscarinic Antagonists: Comparison of Tiotropium and Investigational Drugs

Casarosa, P., Bouyssou, T., Germeyer, S., Schnapp, A., Gantner, F., Pieper, M.

Journal:

Journal of Pharmacology and Experimental Therapeutics

Année:

2009

Langue:

english

Fichier:

PDF, 353 KB

english, 2009

43

Characterization of Lithium Thin Film Batteries by Electrochemical Impedance Spectroscopy

Larfaillou, S., Guy-Bouyssou, D., Le Cras, F., Franger, S.

Journal:

ECS Transactions

Année:

2014

Langue:

english

Fichier:

PDF, 281 KB

english, 2014

44

Patterning of porous SiOCH using an organic mask: Comparison with a metallic masking strategy

Darnon, M., Chevolleau, T., David, T., Ducote, J., Posseme, N., Bouyssou, R., Bailly, F., Perret, D., Joubert, O.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2010

Langue:

english

Fichier:

PDF, 993 KB

english, 2010

45

Residue growth on metallic hard mask after dielectric etching in fluorocarbon based plasmas. II. Solutions

Posseme, N., Bouyssou, R., Chevolleau, T., David, T., Arnal, V., Darnon, M., Brun, Ph., Verove, C., Joubert, O.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Année:

2011

Langue:

english

Fichier:

PDF, 772 KB

english, 2011

46

[IEEE 2011 Materials for Advanced Metallization (MAM) - Dresden, Germany (2011.05.8-2011.05.12)] 2011 IEEE International Interconnect Technology Conference - Impact of ambient atmosphere on plasma-damaged porous low-k characterization

Darnon, M., Chevolleau, T., David, T., Posseme, N., Bouyssou, R., Hurand, R., Joubert, O., Licitra, C., Rochat, N., Bailly, F., Verove, C.

Année:

2011

Langue:

english

Fichier:

PDF, 241 KB

english, 2011

47

Roughening of porous SiCOH materials in fluorocarbon plasmas

Bailly, F., David, T., Chevolleau, T., Darnon, M., Posseme, N., Bouyssou, R., Ducote, J., Joubert, O., Cardinaud, C.

Journal:

Journal of Applied Physics

Année:

2010

Langue:

english

Fichier:

PDF, 2.02 MB

english, 2010

48

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, United States (Sunday 22 February 2015)] Metrology, Inspection, and Process Control for Microlithography XXIX - Scatterometry-based metrology for the 14nm node double patterning lithography

Cain, Jason P., Sanchez, Martha I., Carau, D., Bouyssou, R., Ducoté, J., Dettoni, F., Ostrovsky, A., Le Gratiet, B., Dezauzier, C., Besacier, M., Gourgon, C.

Année:

2015

Langue:

english

Fichier:

PDF, 1.27 MB

english, 2015

49

[International Series in Operations Research & Management Science] Aiding Decisions with Multiple Criteria Volume 44 || From Concordance / Discordance to the Modelling of Positive and Negative Reasons in Decision Aiding

Bouyssou, Denis, Jacquet-Lagrèze, Eric, Perny, Patrice, Słowiński, Roman, Vanderpooten, Daniel, Vincke, Philippe

Année:

2002

Langue:

english

Fichier:

PDF, 2.84 MB

english, 2002

50

Failure Mechanisms Analysis of All-Solid-State Thin Film Microbatteries from an Extended Electrochemical Reliability Study

Grillon, Nathanaël, Bouyssou, Emilien, Jacques, Sébastien, Gautier, Gaël

Journal:

Journal of The Electrochemical Society

Année:

2015

Langue:

english

Fichier:

PDF, 818 KB

english, 2015